Key Features & Specifications
- High Precision Measurements of Semiconductor Devices
- Up to 2000 Volts or 10 Amp Sourcing
- Up to 220 Watts
- 1 Nanoamp Measurement Resolution
- Down to 2 Millivolt Measurement Resolution
- Waveform Comparison
- Envelope Display
- Waveform Averaging
- Dot Cursor
- Kelvin Sense Measurements
- Fully Programmable
- 3.5Inch MS DOSCompatible Disk Storage to Save and Recall Setups
- Manual or Automated High Resolution DC
- Parametric Characterization of Semiconductors
- Incoming Inspection
- Manufacturing Test
- Process Monitoring and Quality Control
- Data Sheet Generation
- Component Matching
- Failure Analysis
The 370A performs DC parametric characterization of transistors, thyristors, diodes, SCRs, MOSFETs, optoelectronic components, solar cells, solid state displays and other semiconductor devices.
In the R&D lab, it is used for characterization of new designs, extraction of SPICE parameters, failure analysis and data sheet generation.
In manufacturing test, the 370A is used to verify device quality and process monitoring.
The 370A is used for incoming inspection to verify device performance, perform failure analysis and to match components.
Interactive Programmable Control
Interactive control of all measurements is accomplished from the full featured front panel or over the GPIB. Operating parameters can be adjusted and stored and recalled using several storage methods including the 370A nonvolatile memory, the built-in MS DOS-compatible floppy disk or to an external controller.
A test fixture is a standard accessory that provides safe device enclosure to ensure operator protection during measurements. The test fixture accommodates standard A1001 through A1005 adapters with Kelvin sensing, 3-Pin adapters without Kelvin sensing and the A1023 and A1024 surface mount adapters.